TESEDA AND Q-STAR TEST TO BUILD COMPLETE STRUCTURAL DFT TEST SYSTEM TO SLASH SoC TEST COSTS AND SPEED TIME TO VOLUME
D.A.T.E. — PARIS, France — March 4, 2002 — Teseda Corporation and Q-Star Test announced a partnership agreement that will help lower the cost and speed the process of testing systems-on-chips (SoCs) that incorporate design-for-test (DFT) structures. Teseda will integrate Q-Star’s quiescent-current (IDDQ) monitor with its DFT-Focused™ test technology for SoCs. With the integration of the companies’ technologies, customers will be able to optimize all major test functions required for a complete DFT-focused flow while dramatically reducing test costs.
Teseda is a venture-funded start-up that is employing patent-pending technology to develop test products. Q-Star is the premier provider of high-speed current-measurement (IDD) based test and measurement solutions.
"Manufacturers are under extreme cost and time pressures to meet market requirements for electronic products," said Steve Morris, president and CEO of Teseda Corporation. "Test is becoming the dominant cost in SoC manufacturing, and through our partnership with Q-Star Test, we can integrate their high-speed IDDQ monitor solutions with our DFT-Optimized™ hardware architecture to provide our mutual, worldwide customers with dramatically lower production cost and shorter time-to-volume."
New Test System with Patented Technologies Reduces Test Cost
A DFT-focused test strategy reduces both time-to-market and the overall cost of test, while maintaining high test quality through techniques such as internal scan test and built-in self-test (BIST). For many SoC manufacturers, IDDQ, which detects silicon defects through highly accurate current measurements, is also part of a low-cost test strategy. Incorporating the advanced Q-Star Test IDDQ monitor into a Teseda DFT-focused test application allows customers to reach the highest possible DFT-based fault coverage while minimizing test times.
"We chose to partner with Teseda because of its innovative technology and its unique electronic design automation and automatic test equipment expertise," said Hans Manhaeve, president, Q-Star Test. "Through our partnership we can help our customers optimize their test flows to leverage low-cost DFT test."
About Q-Star Test nv
Q-Star Test is the premier provider of current-based (IDD) test and measurement solutions. The company offers IDDx monitor solutions, supporting true IDDQ, delta IDDQ, IDDT, and analog IDD test strategies, which apply to digital, analog, and mixed-signal circuits. The company provides standard and customized products and services. Q-Star Test owns several supply current measurement technologies covered by a set of strategic patents. These technologies allow the creation of high-speed, high-accuracy supply current monitors, with the unique characteristic of being virtually transparent to the device under test and the automatic test equipment (ATE). Q-Star Test’s worldwide web address is http://www.qstar.be/. The company is located at L. Bauwensstraat 20, B-8200 Brugge, Belgium.
Teseda Corporation of Portland, Oregon, develops DFT-Focused™ test systems to test complex system-on-chip integrated circuits using patent-pending DFT-Optimized™ hardware technology and DFT-Intelligent™ software to dramatically reduce test cost. For more information visit www.teseda.com.
Teseda and the Teseda logo are trademarks of Teseda Corporation. All other trademarks are property of their respective owners.