PC's Interface Hardware Community
Home Parallel Port Serial Port USB .NET Interface Catalog Article Project Directory

Directory

3 Phase
400 Amp
Allen Bradley
Allen Bradley Drive
Assemblies & EM Devices
Attenuators
Automation
Books And Manuals
Broadcast Measurement
Calibrators, Standards
Capacitors
Card Based
Cellular Test Equipment
Circuit Breakers
Cnc
Control Systems
Counters
Counters & Timers
Crimper
Data Acquisition, Recorders
Datacom & Telecom Measurement
Dayton
Dc
Dc Motor
DeviceNet
Disconnect
Drives
Electric Motor
Electrical Power Measurement
Electronic Component Tools
Ethernet
Fieldbus
Fluke
Frequency Power Meters
Gas Testers
GE
Gear Reduction
Greenlee
Hubbel
ICs & Processors
Impedance LCR Meters
Instrumentation
Klien
LED
Logic Analyzers
Manuals & Books
Meters
Motion Control
Motors
Network Analyzers
Omron
Operator Interface Panels
Optical Test Equipment
Oscilloscope
Oscilloscopes
Parts, Accessories, Plug-Ins
Passive Components
PLC
Power Supplies
Power Supply
Power Transmissions
Probes
Radiation Testers
Reflectometers
Relays, Timers
Robotics
Romex
Satellite And Radar Test
Semiconductors
Sensors
Siemens
Signal Sources, Generators
Sound & Audio Measurement
Spectrum Analyzers
Square D
Switch
Switches For Automation
Tektronix
Television Test Equipment
Temperature Controllers
Thermometers
Time Test Equipment
Tools
Tubes & Acoustics
Valves And Flow Controls
Voltage Regulators
Wire
Wiring For Automation

Automation Articles Page
X-TEL Delivers GSM/GPRS 850/1900 Drive Test Solution with AMR Capabilities and FER Measurements
by Anonymous













LOMBARD, IL. – January 13, 2002 – X-TEL Communications, Inc., a leading provider of engineering test systems and services for the wireless industry, today announced it has begun shipping its GSM 850/1900 MHz drive test system. X-TEL is the first vendor to deliver a system based on Motorola’s popular dual band GSM T720 mobile. X-TEL’s dual band 850/1900 MHz scanner with BSIC demodulation provides scanning capabilities to complement the test mobile. X-TEL’s solution includes full AMR support and provides FER measurements and analysis. The testing devices are integrated with X-TEL’s advanced processing tool Rush Street to provide engineers a complete solution. X-TEL now supports more than 25 test mobiles and scanners across AMPS, TDMA, GSM/GPRS, CDMA and iDEN technologies.

"We believe customers migrating from TDMA to GSM will find our solution particularly attractive," said James Rahfaldt, vice president, X-TEL Communications. "Operators now have the capability to monitor, collect and analyze data on TDMA and GSM AMR networks simultaneously.”

X-TEL’s Rush Street software for GSM/TDMA testing allows users to view TDMA and GSM phone metrics on the same map during drive testing and analysis. The software also includes advanced analysis routines to pinpoint trouble spots while the engineer is still in the field. This eliminates the need for the user to return to a central office and perform traditional post processing. “Network operators are focusing on reducing costs while improving network quality. Rush Street saves valuable time and increases productivity for the engineers in the field, enabling them to diagnose and make improvements to the network in almost real time,” said Rahfaldt.

About X-TEL Communications, Inc.
As a leading provider of engineering test systems and services for the wireless industry, X-TEL Communications, Inc., has built its reputation on an unsurpassable product line and incomparable customer service. X-TEL's products and services are used by some of the largest companies in the wireless communications industry. Information about X-TEL can be found on the Web at www.x-tel.com.



Copyright (c) 2006 Top site of pc interface technology.. All Rights Reserved.